Name
Abstract | ||
|---|---|---|
Technology and product ramp-up suffers increasingly from systematic production defects. Diagnosis of scan-test fail data plays an important role in yield enhancement, as diagnosis of scan fail data helps to understand and overcome systematic production defects. Acquisition of scan fail data during high-volume production may lead to significant test time overhead. A new on-chip architecture is pres... |
Year | DOI | Venue |
|---|---|---|
2007 | 10.1049/iet-cdt:20060129 | IET Computers & Digital Techniques |
Keywords | DocType | Volume |
circuit testing,electronics industry,integrated circuit testing,logic testing,production engineering computing,system-on-chip | Journal | 1 |
Issue | ISSN | Citations |
3 | 1751-8601 | 1 |
PageRank | References | Authors |
0.37 | 7 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| F. Poehl | 1 | 1 | 0.37 |
| M. Beck | 2 | 7 | 2.42 |
| R. Arnold | 3 | 18 | 3.41 |
| J. Rzeha | 4 | 3 | 0.76 |
| T. Rabenalt | 5 | 1 | 0.37 |
| M. Goessel | 6 | 88 | 6.82 |