Name
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/ESSCIRC.2011.6044917 | ESSCIRC |
Keywords | Field | DocType |
random number generation,cmos integrated circuits,cryptography,random sequence | Throughput degradation,Operating frequency,Computer science,Random sequence,CMOS,Electronic engineering,Throughput,Random number generation,Embedded system | Conference |
Citations | PageRank | References |
5 | 0.53 | 7 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Po-Chun Liu | 1 | 45 | 4.01 |
| Ju-Hung Hsiao | 2 | 22 | 2.24 |
| Hsie-Chia Chang | 3 | 474 | 49.13 |
| Chen-Yi Lee | 4 | 1211 | 152.40 |