Name
Title | ||
|---|---|---|
Guardband determination for the detection of off-state and junction leakages in DRAM testing |
Abstract | ||
|---|---|---|
The chips with defects, which escape the test, will cause quality problems, damage the goodwill and decline the revenue. It is important to look for a set of effective and efficient tests in the production line. In this paper, a case study of SDRAM (Synchronous DRAM)/SGRAM (Synchronous Graphics RAM) is used to demonstrate the guardband determination of testing the off-state and junction leakages in the silicon debug stage for production. The consideration of test derivation is both to enhance the yield and to improve the product quality with low-test cost. The electrical modeling of DRAM cell, test selection and guardband determination are introduced. It is shown that the newly created tests can distinguish the normal and abnormal cell current leakages. Promising wafer test results are obtained that the wafer test yield is improved over 8% by laser repairing the weak (defective) cells with the spares and it achieves a reasonable final test quality |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/ATS.2001.990274 | Asian Test Symposium |
Keywords | Field | DocType |
quality problem,integrated circuit testing,dram cell,production testing,synchronous dram,silicon debug stage,synchronous graphics ram,leakage currents,dram testing,junction leakages,sgram,production line,promising wafer test result,sdram,test derivation,dram cell electrical modeling,test selection,dram chips,off-state leakage detection,reasonable final test quality,guardband determination,junction leakage detection,efficient test,wafer test yield improvement,wafer test yield,cell current leakages,product quality,voltage,graphics,leakage current,production,chip | Dram,Wafer,Test selection,Leakage (electronics),Computer science,Read-write memory,Test quality,Voltage,Electronic engineering,Real-time computing,Production line,Embedded system | Conference |
ISSN | ISBN | Citations |
1081-7735 | 0-7695-1378-6 | 5 |
PageRank | References | Authors |
0.59 | 1 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Mill-Jer Wang | 1 | 5 | 0.59 |
| R.-L. Jiang | 2 | 5 | 0.59 |
| J.-W. Hsia | 3 | 5 | 0.59 |
| Chih-Hu Wang | 4 | 25 | 5.03 |
| Jwu-E Chen | 5 | 223 | 28.37 |