Paper Info
Title
A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry
Abstract
The pronounced impact of process uncertainties on the power-performance characteristics of systems has necessitated characterization and design efforts that aim to maximize the parametric yield of the design. This paper describes a completely digital on-chip technique to measure local random variation of FET current. The measurement circuit consists of a series connection of an array of independently selectable devices and a single common load device. The voltage at the intermediate node indicates the variation from device to device, and is digitized by a voltage-controlled oscillator and on-chip frequency counters. This eliminates analog current measurements and enables very rapid, all-digital measurement of single FET variability, which can also be carried out in the field. The effectiveness of the technique is illustrated using measurements results from a test chip designed in a 45-nm SOI process.
Year
DOI
Venue
2009
10.1109/JSSC.2009.2025342
Solid-State Circuits, IEEE Journal of
Keywords
Field
DocType
single fet variability,cmos integrated circuits,local random variability detector,voltage-controlled oscillator,soi process,analog current measurement,size 45 nm,voltage-controlled oscillators,variability,electric current measurement,digital on-chip measurement circuitry,single common load device,digital circuits,on-chip frequency counter,mismatch detection,electric sensing devices,sensor,field effect transistors,fet current,cmos,threshold voltage,radiation detectors,chip,random variable,voltage controlled oscillator
Digital electronics,Computer science,Voltage,Electronic engineering,Chip,CMOS,Voltage-controlled oscillator,Integrated circuit design,Series and parallel circuits,Detector,Electrical engineering
Journal
Volume
Issue
ISSN
44
9
0018-9200
Citations 
PageRank 
References 
10
0.97
6
Authors
3
Name
Order
Citations
PageRank
Rahul M. Rao119519.01
Keith A. Jenkins2567.98
Jae-Joon Kim327537.46