Name
Abstract | ||
|---|---|---|
Nanocomputing technologies hold the promise for higher performance, lower power consumption as well as increased functionality. However, the dependability of these unprecedentedly small scale devices remains uncertain. The main sources of concern are: • Nanometer devices are expected to be highly sensitive to process variations. The guard-bands used today for avoiding the impact of such variations will not represent a feasible solution in the future. Thus, timing errors may occur more frequently. • New failure modes, specific to new materials, are expected to raise serious challenges to the design and test engineers. • Environment induced errors, like single event upsets (SEU), are likely to occur more frequently than in the case of conventional semiconductor devices. • New hardware redundancy techniques are needed to enable development of energy efficient systems. • The increased complexity of the systems based on nanotechnology will require improved computer aided design (CAD) tools, as well as better validation techniques. • Security of nanocomputing systems may be threatened by malicious attacks targeting new vulnerable areas in the hardware. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/DSNW.2010.5542615 | Dependable Systems and Networks |
Keywords | DocType | ISBN |
process variation,semiconductor devices,computer aided design,failure mode,energy efficient | Conference | 978-1-4244-7499-8 |
Citations | PageRank | References |
0 | 0.34 | 6 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jean Arlat | 1 | 1256 | 139.40 |
| Cristian Constantinescu | 2 | 342 | 20.49 |
| Ravishankar K. Iyer | 3 | 3489 | 504.32 |
| Johan Karlsson | 4 | 305 | 25.29 |
| Michael Nicolaidis | 5 | 996 | 129.91 |