Name
Abstract | ||
|---|---|---|
A new method is presented for the calibration and the linearity testing of analog-to-digital converters (ADCs) and dc digital instruments, such as digital voltmeters (DVMs). The test is truly static, because it uses only dc voltages with a small superimposed noise (dithering). It is much faster than that described in the IEEE Standard 1057/94 since it uses a minimal number of test signals and acqu... |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1109/TIM.2008.928878 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Testing,Instruments,Calibration,Linearity,Analog-digital conversion,Voltmeters,Voltage,Maximum likelihood estimation,Measurement standards,Signal resolution | Test method,Static testing,Computer science,Voltage,Maximum likelihood,Converters,Electronic engineering,Estimation theory,Multimeter | Journal |
Volume | Issue | ISSN |
58 | 2 | 0018-9456 |
Citations | PageRank | References |
2 | 0.43 | 3 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Attilio Di Nisio | 1 | 36 | 10.05 |
| Nicola Giaquinto | 2 | 95 | 17.47 |
| Laura Fabbiano | 3 | 5 | 2.66 |
| Giuseppe Cavone | 4 | 25 | 5.19 |
| Mario Savino | 5 | 64 | 10.03 |