Name
Year | DOI | Venue |
|---|---|---|
2000 | 10.1145/343647.343702 | DATE |
Keywords | Field | DocType |
better reliability,embedded dfm tool,vlsi circuits,reliability,design for testability,dfm,process design,design for manufacture,vlsi | Computer science,Manufacturing engineering,Process maturity,Physical design,Design for manufacturability,Very-large-scale integration | Conference |
ISBN | Citations | PageRank |
1-58113-244-1 | 6 | 1.04 |
References | Authors | |
1 | 1 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kees Veelenturf | 1 | 25 | 4.46 |