Name
Abstract | ||
|---|---|---|
In this paper we study the use of the pseudorandom (PR) technique for test and characterization of linear and nonlinear devices, in particular for micro electro mechanical systems (MEMS). The PR test technique leads to a digital built-in-self-test (BIST) technique that is accurate in the presence of parametric variations, noise tolerant, and has high-quality test metrics. We will describe the use of the PR test technique for testing linear and nonlinear MEMS, where impulse response samples of the device under test are considered to verify its functionality. Next, we illustrate and evaluate the application of this technique for linear and nonlinear MEMS characterization. |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1016/j.mejo.2008.05.012 | Microelectronics Journal |
Keywords | Field | DocType |
noise tolerant,nonlinear device,linear and nonlinear mems,micro electro mechanical system,impulse response sample,digital built-in-self-test,nonlinear mems,pseudorandom bist,parametric variation,high-quality test metrics,nonlinear mems characterization,pr test technique,test and characterization,impulse response,device under test | Impulse response,Nonlinear system,Device under test,Microelectromechanical systems,Electronic engineering,Parametric statistics,Engineering,Noise immunity,Electrical engineering,Built-in self-test,Pseudorandom number generator | Journal |
Volume | Issue | ISSN |
40 | 7 | Microelectronics Journal |
Citations | PageRank | References |
2 | 0.40 | 10 |
Authors | ||
5 | ||