Paper Info
Title
A Resistance Matching Based Self-Testable Current-Mode R-2r Digital-To-Analog Converter
Abstract
This paper presents a resistance matching based self-testable current-mode R-2R Digital-to-Analog Converter (DAC). The Built-In Self-Test (BIST) circuits are employed to observe the current redistributions in the resistance matching branches converted from the R-2R network in the DAC, and then the redistributed currents are transformed to voltages to detect the R-2R network with extra Design For Testability (DFT) circuits. The circuit-level simulation of the proposed BIST system are presented to demonstrate the feasibility with fault coverage of 96% for R-2R network and 82.6% for the Operational Amplifier (OpAmp), and area overhead of approximately 6%.
Year
DOI
Venue
2013
10.1587/elex.10.20130753
IEICE ELECTRONICS EXPRESS
Keywords
Field
DocType
built-in self-test, resistance matching, design for testability, digital-to-analog converter
Design for testing,Computer science,Electronic engineering,Digital-to-analog converter,Current mode,Built-in self-test
Journal
Volume
Issue
ISSN
10
23
1349-2543
Citations 
PageRank 
References 
0
0.34
0
Authors
2
Name
Order
Citations
PageRank
Jun Yuan124423.10
Masayoshi Tachibana212.73