Name
Abstract | ||
|---|---|---|
Propagation in non-line-of-sight (NLOS) conditions is one of the major impairments in ultrawideband (UWB) wireless localization systems based on time-of-arrival (TOA) measurements. In this paper the problem of the joint statistical characterization of the NLOS bias and of the most representative features of LOS/NLOS UWB waveforms is investigated. In addition, the performance of various maximum-likelihood (ML) estimators for joint localization and NLOS bias mitigation is assessed. Our numerical results evidence that the accuracy of all the considered estimators is appreciably influenced by the LOS/NLOS conditions of the propagation environment and that a statistical knowledge of multiple signal features can be exploited to mitigate the NLOS bias, reducing the overall localization error. |
Year | Venue | Field |
|---|---|---|
2012 | CoRR | Non-line-of-sight propagation,Computer science,Electronic engineering |
DocType | Volume | ISSN |
Journal | abs/1203.2890 | Montorsi, F.; Pancaldi, F.; Vitetta, G.; "Statistical
Characterization and Mitigation of NLOS Bias in UWB Localization Systems,"
Advances in Electronics and Telecommunications, pp. 11-17, Issue no 4, ISSN
2081-8580 |
Citations | PageRank | References |
1 | 0.36 | 2 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Francesco Montorsi | 1 | 12 | 3.51 |
| Fabrizio Pancaldi | 2 | 154 | 14.73 |
| Giorgio Matteo Vitetta | 3 | 130 | 13.97 |