Name
Title | ||
|---|---|---|
Multiphysics Modeling and Analysis of the Photoinductive Imaging Effect for Crack Detection |
Abstract | ||
|---|---|---|
Numerical multiphysics modeling of the photoinductive imaging (PI) effect was performed with a 2-D transient to characterize corner cracks at the edge of a specimen with a bolt hole. We present how the finite-element method (FEM) can be utilized to model the PI effect and observe the influence of critical factors on the coil probe impedance for a rectangular crack in the Ti-6Al-4V specimen. As anticipated, the proposed model can show that the PI method has a higher spatial resolution in the defect in 2-D models compared to the conventional eddy current testing method. The FEM simulation results for 0.25-, 0.50-, and 0.75-mm rectangular notches are shown and discussed. The effects of coil current frequency, laser-point temperature, and lift-off distance on the PI signal are also examined and analyzed. We demonstrate that the PI effect is a novel sensing method for characterizing the geometric shape of cracks and that the enhanced output signals of the coil probe can also be obtained given an appropriate quantity of factors. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/TIM.2009.2024369 | IEEE T. Instrumentation and Measurement |
Keywords | Field | DocType |
photoinductive imaging (pi),crack detection,eddy current testing (ect),finite-element method (fem),coil current frequency,2-d transients,multiphysics modeling,coil probe,laser materials processing,optical images,fem,nondestructive testing (ndt),coil probe impedance,eddy current testing,fem simulation,finite element analysis,photoinductive imaging effect,numerical multiphysics modeling,modeling,laser-point temperature,finite-element method,finite element methods,finite element method,impedance,spatial resolution,nondestructive testing,image analysis | Eddy-current testing,Multiphysics,Electronic engineering,Electrical impedance,Finite element method,Laser,Electromagnetic coil,Geometric shape,Image resolution,Mathematics | Journal |
Volume | Issue | ISSN |
59 | 2 | 0018-9456 |
Citations | PageRank | References |
1 | 0.48 | 4 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Cheng-Chi Tai | 1 | 8 | 5.43 |
| Yen-Lin Pan | 2 | 4 | 1.60 |