Paper Info
Title
Characterization and Implicit Identification of Sequential Indistinguishability
Abstract
Effective diagnosis of integrated circuits relies critically on the quality of diagnostic test vectors. Diagnostic test pattern generation aims at producing test vectors that distinguish between all distinguishable pairs of faults, and proving the remaining pairs of faults to be indistinguishable. Proving indistinguishabilities, much like proving undetectabilities in the case of detection-oriented test pattern generation, requires substantial computational effort. In this paper, we simplify the problem by showing that a significant number of indistinguishability relations can be proven implicitly, with little computational effort. Sequential indistinguishability is characterized and conditions for the identification of new indistinguishability relations based on already existing relations are established. Experiments on the ISCAS 89 benchmark circuits are presented to indicate the significant improvements achievable by the implicit identification of indistinguishabilities.
Year
DOI
Venue
1997
10.1109/ICVD.1997.568156
VLSI Design
Keywords
Field
DocType
test vector,sequential indistinguishability,new indistinguishability relation,implicit identification,computational effort,indistinguishability relation,detection-oriented test pattern generation,diagnostic test vector,diagnostic test pattern generation,proving indistinguishability,combinational circuits,face detection,sequential analysis,integrated circuits,integrated circuit,diagnostic test,identification,sequential circuits
Pattern generation,Sequential logic,Computational indistinguishability,Diagnostic test,Computer science,Logic testing,Algorithm,Test pattern generators,Electronic engineering,Theoretical computer science,Combinational logic,Face detection
Conference
ISBN
Citations 
PageRank 
0-8186-7755-4
5
0.60
References 
Authors
10
3
Name
Order
Citations
PageRank
V. Boppana1472.89
I. Hartanto2333.62
W. Kent Fuchs31469279.02