Name
Abstract | ||
|---|---|---|
After recalling fundamentals of a recent model, the paper illustrates an application on a real device. The result is the measurement of a number of important parameters, related to physics and technology of a laser diode, which is in turn useful to address the failure analysis in case of degradation. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1016/j.microrel.2011.07.065 | Microelectronics Reliability |
Keywords | Field | DocType |
failure analysis | Laser diode,Diode,Electronic engineering,Laser,Engineering,Optoelectronics | Journal |
Volume | Issue | ISSN |
51 | 9 | 0026-2714 |
Citations | PageRank | References |
3 | 0.72 | 2 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Massimo Vanzi | 1 | 35 | 12.63 |
| G. Mura | 2 | 10 | 3.17 |
| G. Martines | 3 | 4 | 1.46 |