Title
A Simple Testing Technique for Embedded Systems
Abstract
Embedded systems are constrained and critical. They need to be validated before their development. They handle time constraints to model important aspects (delays, timeouts). This issue has to be taken into account in every step during its development life cycle, in particular in the testing step. This paper presents a methodology for the development of reliable embedded systems. A system is described as a timed automaton. It details an efficient derivation algorithm of test sequences able to identify controllable states on the system. Most of known errors of such systems are collected. They are automatically integrated on the derived sequences which are submitted to the implementation. If the system behaves correctly after this submission, the system is considered as robust.
Year
DOI
Venue
2003
10.1007/978-3-540-27860-3_16
Lecture Notes in Computer Science
Keywords
Field
DocType
life cycle,embedded system,timed automaton
Robustness testing,Computer science,Critical system,Automaton,Test sequence,Timed automaton,Retard,Software development process,Reactive system,Embedded system,Distributed computing
Conference
Volume
ISSN
Citations 
3144
0302-9743
3
PageRank 
References 
Authors
0.45
8
2
Name
Order
Citations
PageRank
Hacène Fouchal115938.35
Antoine Rollet2629.53