Name
Abstract | ||
|---|---|---|
We present an embedded boundary-scan test vector management solution that ensures the correct version of test vectors is applied to the unit under test (UUT). This new vector management approach leverages the system-level boundary-scan multi-drop architecture employed in some high availability electronic systems. Compared to previous methods that do not use system-level boundary-scan resources for vector management, this new approach ensures that the correct boundary-scan vectors are retrieved from the UUT without affecting its operation and requires minimal UUT functionality to execute. The performance and effectiveness of this technique is shown using an actual design example that has been realized in a new product |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/TEST.2005.1584041 | ITC |
Keywords | Field | DocType |
unit under test,automatic test equipment,high availability | Test vector,Device under test,System testing,Computer science,Automatic test equipment,Supply chain management,Computer hardware,High availability,Embedded system,New product development,Built-in self-test | Conference |
ISBN | Citations | PageRank |
0-7803-9038-5 | 1 | 0.43 |
References | Authors | |
2 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Bradford G. Van Treuren | 1 | 4 | 2.47 |
| Bryan E. Peterson | 2 | 1 | 0.43 |
| Jose M. Miranda | 3 | 7 | 1.81 |