Name
Title | ||
|---|---|---|
Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards |
Year | Venue | Keywords |
|---|---|---|
1982 | ITC | printed circuit board |
Field | DocType | Citations |
Boundary scan,Flying probe,Diagnostic board,Computer science,Automatic test equipment,Printed circuit board,Circuit design,Electronic engineering,Joint Test Action Group | Conference | 1 |
PageRank | References | Authors |
0.80 | 0 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Herold Levine | 1 | 1 | 0.80 |
| Charles Berking | 2 | 1 | 1.14 |
| Alan Blair | 3 | 1 | 1.14 |
| Kenneth R. Bowden | 4 | 75 | 10.56 |
| Peter Debruyn Kops | 5 | 1 | 0.80 |
| David Giles | 6 | 4 | 1.99 |
| David Ruhoff | 7 | 1 | 0.80 |
| Kenneth Wacks | 8 | 7 | 2.19 |