Name
Abstract | ||
|---|---|---|
Compression has been used in automatic test equipment (ATE) to reduce storage and application time for high volume data by exploiting the repetitive nature of test vectors. The application of a binary compression method to an ATE environment for manufacturing is studied using a technique, referred to as reuse. In reuse, compression is achieved by partitioning the vector set and removing repeating ... |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/TIM.2003.822703 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Data compression,Automatic test equipment,System-on-a-chip,Automatic testing,System testing,Decoding,Storage automation,Manufacturing,Hardware,Circuits | Data compression ratio,System on a chip,Automatic test equipment,Computer science,System testing,Electronic engineering,Decoding methods,Data compression,Test compression,Computer hardware,Image compression | Journal |
Volume | Issue | ISSN |
53 | 2 | 0018-9456 |
Citations | PageRank | References |
5 | 0.58 | 16 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Farzin Karimi | 1 | 17 | 2.49 |
| Zainalabedin Navabi | 2 | 303 | 51.08 |
| Waleed Meleis | 3 | 157 | 18.29 |
| Fabrizio Lombardi | 4 | 1985 | 259.25 |