Name
Year | DOI | Venue |
|---|---|---|
1991 | 10.1109/TEST.1991.519502 | ITC |
Keywords | Field | DocType |
testability features,system testing,registers,microcontrollers,voltage,design for test | Design for testing,Testability,System testing,Logic testing,Computer science,Electronic engineering,Microcontroller,Embedded system | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-8186-9156-5 | 1 |
PageRank | References | Authors |
0.49 | 3 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jose A. Lyon | 1 | 1 | 0.83 |
| Mike Gladden | 2 | 1 | 0.49 |
| Eytan Hartung | 3 | 1 | 0.49 |
| Eric Hoang | 4 | 1 | 0.83 |
| K. Raghunathan | 5 | 1 | 0.49 |