Title
Label inspection using the Hough transform on transputer networks
Abstract
A variation of the Hough transform, the special normal/angle Hough transform (RθsHT) is described detailing its characteristics and advantages and suitability for a parallel implementation. The transputer is introduced and the application of the RθsHT on two popular types of transputer networks, a control-driven array and a demand-driven farm of transputers, is described. The methods employed for communication and the breakdown of the algorithms are described for each type of network. Timing results for the implementation on both networks are provided. The use of the RθsHT is then further examined with application to the problem of label inspection, and two types of labels are used to demonstrate how to pass or fail labels under inspection.
Year
DOI
Venue
1991
10.1016/0141-9331(91)90137-5
Microprocessors & Microsystems
Keywords
DocType
Volume
transputers,label inspection,hough transforms,transputer network,hough transform
Journal
15
Issue
ISSN
Citations 
3
Microprocessors and Microsystems
4
PageRank 
References 
Authors
0.73
9
3
Name
Order
Citations
PageRank
M. Mirmehdi114011.10
G. A. W. West25512.60
G. R. Dowling340.73