Title
Benchmarking Mos Transistor Models With Respect To Capacitances And Charges For Analog Applications
Year
Venue
Keywords
1995
1995 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-3
capacitance,integrated circuit design
Field
DocType
ISSN
Parasitic capacitance,Transistor model,Capacitance,Computer science,Spice,Electronic engineering,Integrated circuit design,Mixed-signal integrated circuit,MOSFET,Electronic circuit,Electrical engineering
Conference
0277-674X
Citations 
PageRank 
References 
0
0.34
1
Authors
3
Name
Order
Citations
PageRank
Ute Feldmann16719.48
Alexander Rahm221.23
Michiko Miura-mattausch342.15