Abstract | ||
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The fatigue behaviour of joints between ceramic LTCC modules and FR-4 boards was investigated using thermal cycling tests at temperature intervals of 0 degreesC - 100 degreesC and -40 degreesC - 125 degreesC and analysis of the cycled modules using scanning acoustic microscopy and SEM/EDS. The assemblies were fabricated with Ag-Pd and Ag-Pt metallized pads on LTCC. Fatigue cracks initiated in the solder region of the Ag-Pd metallized LTCC modules, but propagated later in the ceramic module. Propagation was remarkably retarded by Ag-filled vias located under the pads on LTCC. The final cracks that caused an electrical failure in the modules crossed the root region of the vias along the thick Ag3Sn+PdSn4 layer located in this region. The joints of the Ag-Pt metallized modules passed the resistance measurement in both tests. However, they also showed crack growth that initiated on the LTCC/metallization interface, propagated in the ceramic, but was retarded by the vias. These vias were resistant to fracture, since only a thin Ag3Sn layer (approximate to 1 mum) existed in their root region. (C) 2001 Elsevier Science Ltd. All rights reserved. |
Year | DOI | Venue |
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2001 | 10.1016/S0026-2714(01)00163-9 | Microelectronics Reliability |
DocType | Volume | Issue |
Journal | 41 | 9 |
ISSN | Citations | PageRank |
0026-2714 | 2 | 0.94 |
References | Authors | |
0 | 5 |
Name | Order | Citations | PageRank |
---|---|---|---|
R. Rautioaho | 1 | 7 | 2.10 |
O. Nousiainen | 2 | 7 | 2.10 |
S. Leppävuori | 3 | 2 | 0.94 |
J. Lenkkeri | 4 | 2 | 0.94 |
T. Jaakola | 5 | 2 | 0.94 |