Name
Title | ||
|---|---|---|
Refractive index characterization of waveguide channels using spectroscopic ellipsometry. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/EUROCON.2011.5929385 | EUROCON |
Keywords | Field | DocType |
indexing terms,refractive index,optical waveguide,optimization,data analysis,thin film,multi objective optimization,optical waveguides,spectroscopy,ellipsometry,genetic algorithms,genetic algorithm | Waveguide (optics),Computer science,Waveguide,Electronic engineering,Thin film,Refractive index contrast,Spectroscopy,Optoelectronics,Silicon,Ellipsometry,Refractive index | Conference |
Citations | PageRank | References |
0 | 0.34 | 2 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Vasco R. Fernandes | 1 | 0 | 0.34 |
| Carlos M. S. Vicente | 2 | 1 | 2.10 |
| E. Pecoraro | 3 | 0 | 0.34 |
| Naoya Wada | 4 | 62 | 29.69 |
| Paulo S. André | 5 | 3 | 4.60 |
| Rute A. S. Ferreira | 6 | 1 | 3.11 |