Name
Abstract | ||
|---|---|---|
The transfer matrix method was used to calculate the transmission of electromagnetic waves through alternate layers of thin silver films separated by air. It was found that the plasma frequency is a clear divide between good and poor transmission. Equally the calculations show that for frequencies above the plasma frequency the transmission coefficient shows a Bragg-like behavior with oscillations that manifest coherent reflections on the entrance side of the layer at favored wavelengths. |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1016/j.mejo.2008.11.047 | Microelectronics Journal |
Keywords | Field | DocType |
novel property,thin-film optics,electromagnetic wave,clear divide,light transmission,entrance side,silver thin film,multilayer structures,plasma frequency,coherent reflection,favored wavelength,bragg-like behavior,alternate layer,multilayer stack,poor transmission,transmission coefficient,thin film,electromagnetic waves,transfer matrix method,oscillations | Transfer-matrix method (optics),Transmission coefficient,Optics,Electronic engineering,Bragg's law,Thin film,Thin-film optics,Engineering,Electromagnetic radiation,Plasma oscillation,Wavelength | Journal |
Volume | Issue | ISSN |
40 | 4-5 | Microelectronics Journal |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Arturo Robledo-Martinez | 1 | 0 | 0.34 |
| Juan Carlos Sandoval | 2 | 0 | 0.34 |
| P. Pereyra | 3 | 0 | 2.03 |