Name
Abstract | ||
|---|---|---|
Transport and noise characteristics of forward and reverse biased single-crystal silicon solar cells were measured in order to evaluate the solar cell technology. Stress comprising an temperature of 400 K and a DC electric field were applied to a total of 20 solar cells for a period of 5000 h. The samples were quality and reliability screened using noise reliability indicators. From the measurement results it follows that the noise spectral density related to defects is of 1/f type and its magnitude was found to be proportional to the square of the DC forward current at low injection levels. It has been established that samples showing low noise feature high-conversion efficiency. It has also been found out that there is a strong correlation between the sample initial-condition noise and the efficiency after 5000 h of combined stressing. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1016/S0026-2714(01)00219-0 | Microelectronics Reliability |
Keywords | Field | DocType |
non destructive testing,spectral density,conversion efficiency,initial condition,electric field | Flicker noise,Electric field,Noise (electronics),Y-factor,Electronic engineering,Solar cell,Noise spectral density,Engineering,Solar cell efficiency,Silicon | Journal |
Volume | Issue | ISSN |
41 | 12 | 0026-2714 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
1 | ||