Name
Title | ||
|---|---|---|
New methodology for the assessment of the thermal resistance of laser diodes and light emitting diodes |
Abstract | ||
|---|---|---|
In this paper, we propose a new method to evaluate the thermal resistance of laser diodes and light emitting diodes based on the analysis of common emitter characteristics (emission spectrum, power–current and voltage–current characteristics) measured in CW condition. This method has been used to assess the thermal resistance of commercial GaAlAs laser and light emitting diodes emitting at 780nm and 872nm respectively. Finally, the method is compared with classic threshold current method carried out on the laser diodes. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1016/j.microrel.2009.11.002 | Microelectronics Reliability |
Keywords | Field | DocType |
light emitting diode,spectrum,thermal resistance | Continuous wave,Threshold current,Common emitter,Emission spectrum,Diode,Optics,Laser,Light-emitting diode,Engineering,Optoelectronics,Thermal resistance | Journal |
Volume | Issue | ISSN |
50 | 4 | 0026-2714 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| David Veyrié | 1 | 1 | 0.71 |
| Olivier Gilard | 2 | 2 | 2.68 |
| Kevin Sanchez | 3 | 9 | 5.44 |
| Sébastien Lhuillier | 4 | 0 | 0.34 |
| Frédéric Bourcier | 5 | 0 | 0.34 |