Name
Abstract | ||
|---|---|---|
Linear Feedback Shift-Registers have been studied for a long time as interesting solutions for error detection and correction techniques in transmissions. In the test domain, and principally in Built-In Self Test applications, they are often used as generators of pseudo-random test sequences. Conversely, their potential to generate prescribed deterministic test sequences is dealt within more recent works, and nowadays, allows the investigation of efficient test with a pseudo-deterministic BIST technique. Pseudo-deterministic test sequences are composed of both deterministic and pseudo-random test patterns and offer high fault coverage with a tradeoff between test length and hardware cost. In this paper, synthesis techniques for LFSRs that embed such kind of sequences are described. |
Year | DOI | Venue |
|---|---|---|
1998 | 10.1016/S0167-9260(98)00005-4 | Integration |
Keywords | Field | DocType |
built-in self test,hardware test pattern generator,theoretical property,linear feedback shift register,random testing,fault coverage,error detection and correction | Automatic test pattern generation,Shift register,Fault coverage,Computer science,Algorithm,Error detection and correction,Real-time computing,Electronic engineering,Self test,Integrated circuit,Deterministic testing,Built-in self-test | Journal |
Volume | Issue | ISSN |
25 | 1 | Integration, the VLSI Journal |
Citations | PageRank | References |
3 | 0.42 | 31 |
Authors | ||
1 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Christian Dufaza | 1 | 48 | 5.87 |