Title
Approximation of the BTE by a Relaxation-time Operator: Simulations for a 50 nm-channel Si Diode
Abstract
In this work we present comparisons between DSMC simulations of the full BTE and deterministic simulations of a relaxation-time approximation for a nowadays size Si diode. We assume a field dependent relaxation time fitted to give the same drift speed (mean velocity) as DSMC simulations for bulk Si. We compute the density, mean velocity, force field, potential drop, energy and I-V curves of both models and plot the pdf of the deterministic relaxation-time model, We also compare the results to augmented drift-diffusion models proposed in the literature to approximate the relaxation time system in the quasi-ballistic regime. The quasi-ballistic and ballistic regimes are distinguished by using local dimensionless parameters.
Year
DOI
Venue
2001
10.1155/2001/35094
VLSI DESIGN
Keywords
DocType
Volume
DSMC simulation,relaxation-time,WENO deterministic methods,full BTE,quasiballistic and ballistic regime
Journal
13
Issue
ISSN
Citations 
SP1-4
1065-514X
1
PageRank 
References 
Authors
0.42
1
4
Name
Order
Citations
PageRank
Marcello A. Anile171.86
José A. Carrillo27117.02
Irene M. Gamba38612.52
Chi-Wang Shu410.76