Name
Abstract | ||
|---|---|---|
The importance of cycle time reduction is well known to the semiconductor manufacturing industry in the sense of reduced inventory costs and faster response to the market. Less emphasized is the fact that the overall die yield is also closely related to cycle time. In particular, some yield losses are due to “excursions,” when process or equipment shift out of specifications. While some and perhap... |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/TASE.2010.2041450 | IEEE Transactions on Automation Science and Engineering |
Keywords | Field | DocType |
Semiconductor device manufacture,Production,Fabrication,Manufacturing industries,Costs,Inspection,Pulp manufacturing,Computer aided manufacturing,Life testing,Manufacturing processes | Revenue,Production cycle,Mathematical optimization,Life cycle costing,Industrial engineering,Semiconductor device modeling,Computer science,Semiconductor device fabrication,Inventory control,Excursion,Semiconductor materials,Reliability engineering | Journal |
Volume | Issue | ISSN |
8 | 1 | 1545-5955 |
Citations | PageRank | References |
10 | 1.56 | 0 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Robert C. Leachman | 1 | 77 | 10.00 |
| Shengwei Ding | 2 | 226 | 18.81 |