Name
Abstract | ||
|---|---|---|
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A non-robust delay test is used while each test vector is compacted to detect multiple transition faults in a standard scan-based design targeting a stuck-at fault test. Our test technique applied to a microprocessor designed with 6M gate logic, 4MB level 2 cache, and 239K latches, achieves 90% coverage using 3,103 test vectors. We estimate the distribution of the delay of paths covered by our delay test. We also show the effectiveness of our method by discussing the correlation between the screening result and the actual number of delay defects. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1145/1118299.1118387 | ASP-DAC |
Keywords | Field | DocType |
test vector,actual number,delay defect screening,delay test,sparc64 microprocessor,delay defect,stuck-at fault test,screening result,test technique,non-robust delay test,screening | Delay calculation,Test vector,Logic gate,Logic testing,Computer science,Cache,Microprocessor,Real-time computing,Electronic engineering,Screening Result,Test compression | Conference |
ISSN | ISBN | Citations |
2153-6961 | 0-7803-9451-8 | 1 |
PageRank | References | Authors |
0.37 | 10 | 15 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Noriyuki Ito | 1 | 21 | 3.75 |
| Akira Kanuma | 2 | 1 | 0.71 |
| Daisuke Maruyama | 3 | 51 | 4.32 |
| Hitoshi Yamanaka | 4 | 34 | 2.37 |
| Tsuyoshi Mochizuki | 5 | 1 | 0.37 |
| Osamu Sugawara | 6 | 1 | 0.37 |
| Chihiro Endoh | 7 | 1 | 0.37 |
| Masahiro Yanagida | 8 | 2 | 1.08 |
| Takeshi Kono | 9 | 1 | 0.71 |
| Yutaka Isoda | 10 | 4 | 1.13 |
| Kazunobu Adachi | 11 | 1 | 0.37 |
| Takahisa Hiraide | 12 | 43 | 2.97 |
| Shigeru Nagasawa | 13 | 1 | 1.05 |
| Yaroku Sugiyama | 14 | 7 | 1.26 |
| Eizo Ninoi | 15 | 1 | 0.37 |