Name
Abstract | ||
|---|---|---|
A recent study [1] showed corrosion phenomena in LiNbO-based optical modulators, used for external laser modulation in 10 Gbit systems, when tested (Bellcore 468) at 40 degreesC 95%RH under 10 V, 3 V and 0 V bias. Environmental conditions, typical of storage tests, were not too different from their operating level, while 10 V bias was roughly 3 times its standard value. The most straightforward interpretation of some residual contaminant introduced by a final polymeric passivation step was then evaluated by testing identical, nonpassivated devices. The occurrence of similar degradation even in that case moved the focus on Anodic Gold Corrosion as an intrinsic mechanism of the technology under test, recalling similar phenomena occurred on Si devices some 20 years ago. On the other hand, the evidence for different robustness vs. that mechanism for quite comparable devices from another supply points out the incomplete knowledge of the many factors that may switch or enhance the phenomenon. (C) 2001 Published by Elsevier Science Ltd. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1016/S0026-2714(01)00199-8 | Microelectronics Reliability |
Keywords | Field | DocType |
optical modulator | Optical modulator,Optics,Electronic engineering,Engineering,Damp,Optoelectronics | Journal |
Volume | Issue | ISSN |
41 | 9 | 0026-2714 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| P. Furcas | 1 | 0 | 0.68 |
| R. De Palo | 2 | 0 | 0.34 |
| M.E. Patella | 3 | 0 | 0.34 |
| G. Salmini | 4 | 0 | 0.68 |
| M. Vanzi | 5 | 89 | 33.52 |