Name
Year | DOI | Venue |
|---|---|---|
1999 | 10.1109/TEST.1999.805849 | ITC |
Keywords | Field | DocType |
high level atpg,automatic test pattern generation,sun,testing | Automatic test pattern generation,Software debugging,Fault coverage,Computer science,Real-time computing,Electronic engineering,Design activities | Conference |
ISBN | Citations | PageRank |
0-7803-5753-1 | 0 | 0.34 |
References | Authors | |
0 | 1 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Scott Davidson | 1 | 56 | 22.93 |