Name
Abstract | ||
|---|---|---|
We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. Of particular interest, and a main contribution of this paper, is the BIST-based hardware implementation and measurement of amplifier linearity (IP3) test using DDS. The approach described in this paper has been implemented in Verilog and synthesized into FPGAs where it was used for functional testing and compared to simulation results. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/ITC.2004.41 | ITC |
Keywords | Field | DocType |
functional testing,direct digital synthesizer,amplifiers,automatic test pattern generation,hardware description languages,direct digital synthesis,field programmable gate arrays | Automatic test pattern generation,Digital pattern generator,Computer science,Field-programmable gate array,Electronic engineering,Verilog,Direct digital synthesizer,Spectrum analyzer,Built-in self-test,Hardware description language | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-8581-0 | 5 |
PageRank | References | Authors |
0.74 | 9 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Foster F. Dai | 1 | 20 | 6.51 |
| Charles E. Stroud | 2 | 470 | 41.17 |
| Dayu Yang | 3 | 24 | 4.24 |
| Shuying Qi | 4 | 5 | 0.74 |