Title
Flat-A Fast Lattice-Based Algorithm For Test Suite Reduction
Abstract
Software testing is a critical part of software development that consumes a considerable amount of the development time and effort. One of the main factors that greatly affects the testing cost is the construction and execution time of test suites. Several research efforts have been focusing on developing minimization algorithms to reduce the size of test suites, and hence the overall testing time. This paper proposes a new minimization algorithm, namely, the fast lattice-based (FLAT) algorithm that can construct a minimized test suite in a smaller time as compared to that needed by the known Delayed-Greedy (DG) algorithm. Evaluation results show that, for some test suites, the proposed algorithm can reduce the construction time of the minimized test suites by more than 80% as compared to that of the DG algorithm.
Year
Venue
Field
2010
22ND INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING & KNOWLEDGE ENGINEERING (SEKE 2010)
Test suite,Data mining,Lattice (order),Computer science,Computational science
DocType
Citations 
PageRank 
Conference
0
0.34
References 
Authors
0
3
Name
Order
Citations
PageRank
Ahmed Raafat Abuzeid100.34
Haitham S. Hamza222131.29
Ismail Abdel Hamid Taha300.34