Name
Abstract | ||
|---|---|---|
As microelectronics evolves smaller into the nanometric scale, external interferences starts to be harmful to the system expected behavior. As classical systems do not handle adequately faults caused by such sources, new topologies are proposed. Our present work proposes a solution for this problem consisting on the use of sigma-delta modulation in order to obtain a faulttolerance even in presence of multiple faults. This paper provides the mathematical analysis and demonstration to support the proposed approach. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/ETS.2006.19 | European Test Symposium |
Keywords | Field | DocType |
new topology,classical system,mathematical analysis,sigma-delta modulated signals,multiple fault,fault-tolerant circuits,present work,nanometric scale,external interference,sigma-delta modulation,sigma delta modulator,interference,fault tolerance,delta sigma modulation,fault tolerant,production,digital filters | Digital filter,Microelectronics,Computer science,Delta-sigma modulation,Electronic engineering,Network topology,Real-time computing,Modulation,Fault tolerance,Interference (wave propagation),Single event upset | Conference |
ISSN | ISBN | Citations |
1530-1877 | 0-7695-2566-0 | 3 |
PageRank | References | Authors |
0.50 | 2 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Erik Schuler | 1 | 18 | 4.83 |
| Daniel Scain Farenzena | 2 | 3 | 0.84 |
| Luigi Carro | 3 | 1393 | 166.42 |