Title | ||
---|---|---|
A New Measurement System for the Perpendicular Complex Permittivity to DUT Sheet by Stripline Simulation. |
Abstract | ||
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The relative dielectric constant εr is calculated by quasi-static and frequency-dependent hybrid-mode analysis of two layers of dielectric materials (a sample material and a resonator base material) after measuring the rate of change of the resonating frequency of a sheet material under test sandwiched between a sheet metal and a calibrated stripline resonator. This method corrects the fringing ef... |
Year | DOI | Venue |
---|---|---|
2012 | 10.1109/TIM.2012.2192334 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Resonant frequency,Frequency measurement,Stripline,Permittivity measurement,Sheet materials | Network analyzer (electrical),Permittivity,Dielectric,Resonator,Electronic engineering,Relative permittivity,Stripline,Calibration,Mathematics,Sheet metal | Journal |
Volume | Issue | ISSN |
61 | 9 | 0018-9456 |
Citations | PageRank | References |
1 | 0.39 | 1 |
Authors | ||
3 |
Name | Order | Citations | PageRank |
---|---|---|---|
Hirosuke Suzuki | 1 | 4 | 1.73 |
Tomio Hotchi | 2 | 1 | 0.39 |
Toshio Nojima | 3 | 13 | 9.63 |