Name
Abstract | ||
|---|---|---|
This paper is concerned with fault detection and location of discrete event systems (DES) modeled using interpreted Petri nets (IPN). The approach held deals with IPN models in which the marking is partially known. A diagnosis scheme that tracks the DES inputs and outputs is proposed; it allows detecting and locating an unexpected behavior within the DES. The diagnoser handles a monitoring model, expressed also as an IPN, which is computed from the DES model through an induced conservative marking law. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/ICSMC.2005.1571384 | Systems, Man and Cybernetics, 2005 IEEE International Conference |
Keywords | Field | DocType |
Petri nets,discrete event systems,fault location,manufacturing systems,process monitoring,DES,IPN models,conservative marking law,discrete event systems,fault detection,fault diagnosis,fault location,interpreted Petri nets,manufacturing systems,monitoring model,Fault diagnosis,Interpreted Petri Nets,diagnosability of Discrete Event Systems | Petri net,Manufacturing systems,Computer science,Fault detection and isolation,Real-time computing,Stochastic Petri net | Conference |
Volume | ISSN | ISBN |
2 | 1062-922X | 0-7803-9298-1 |
Citations | PageRank | References |
1 | 0.36 | 7 |
Authors | ||
8 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Elvia Ruiz-beltrán | 1 | 1 | 1.38 |
| Jimenez-Ochoa, I. | 2 | 1 | 0.36 |
| Antonio Ramírez-treviño | 3 | 145 | 23.87 |
| Ernesto López-mellado | 4 | 127 | 26.01 |
| Maria Elena Meda-campaña | 5 | 9 | 3.31 |
| Ruiz-Beltran, E. | 6 | 1 | 0.36 |
| Ramirez-Trevino, A. | 7 | 7 | 2.94 |
| Lopez-Mellado, E. | 8 | 3 | 2.80 |