Abstract | ||
---|---|---|
Line scratch is the primary artifact in old films. In this paper a new algorithm for line scratch detection and removal is proposed. First, we establish an effective model to represent fine scratches in the domain of Over-complete Wavelet Expansion (OWE), which offers more precise position description for scratches than traditional downsampled wavelet transform. We then use it to detect and locate line scratches accurately. After that, an adaptive restoration method is adopted to remove fine scratches by replacing the wavelet coefficients in line scratches of each scale with new interpolated wavelet coefficients of corresponding width computed from the line scratch model. Experiments show that the proposed method can detect more line artifacts with less false detection and remove the fine scratches effectively as compared with the classic algorithm. |
Year | DOI | Venue |
---|---|---|
2007 | 10.1109/ISCAS.2007.378364 | ISCAS |
Keywords | Field | DocType |
image restoration,wavelet transforms,information processing,wavelet transform,image reconstruction,motion pictures,sun,interpolation | False detection,Computer vision,Scratch,Computer science,Interpolation,Algorithm,Wavelet expansion,Artificial intelligence,Image restoration,Wavelet packet decomposition,Wavelet,Wavelet transform | Conference |
Volume | Issue | ISSN |
null | null | null |
ISBN | Citations | PageRank |
1-4244-0921-7 | 4 | 0.51 |
References | Authors | |
7 | 6 |
Name | Order | Citations | PageRank |
---|---|---|---|
Jin Xu | 1 | 4 | 0.51 |
Jinghuo Guan | 2 | 4 | 0.51 |
Xingdong Wang | 3 | 8 | 1.36 |
Jun Sun | 4 | 1060 | 79.09 |
Guangtao Zhai | 5 | 1707 | 145.33 |
Z. Li | 6 | 1578 | 164.19 |