Title
Characterization of Logical Effort for Improved Delay.
Abstract
In this paper, an effort has been made to improve the delay of a gate by skewing the gates by choosing proper sizing. The expression for skewed logical effort has been derived for universal logic gates namely NOT, NAND and NOR for minimizing the delay. The validations for minimum delay through simulation was done on a chain of inverters. The improved skewed gates showed 10% - 20% delay reduction on a chain of inverters as compared with normal skewed gate, high and low skewed gates, whereas, an improvement of 20% - 25% when compared to skewed gates favoring a particular transition. All simulations are done using Spectre in Cadence environment in UMC90nm CMOS technology at 1V power supply.
Year
DOI
Venue
2013
10.1007/978-3-642-42024-5_14
Communications in Computer and Information Science
Keywords
Field
DocType
Characterization,CMOS technology,delay,logical effort,skewed gate
Delay calculation,Cadence,Universal logic,CMOS,Electronic engineering,NAND gate,Logical effort,Sizing,Electrical engineering,Mathematics
Conference
Volume
ISSN
Citations 
382
1865-0929
0
PageRank 
References 
Authors
0.34
2
3
Name
Order
Citations
PageRank
Sachin Maheshwari153.03
Himadri Singh Raghav211.04
Anu Gupta383.99