Name
Abstract | ||
|---|---|---|
Given the reliability principles and failure mechanism of MEMS, this paper discussed the accelerated test from three aspects as follows: the connotation of the test including concept and meaning; the scope of application concerned with product levels for applicants in types of stress; test process includes the test objective determination, test stressing selection, the test profile designing, the implementation scheme determining, analysis and improvement measures. ©2010 IEEE. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/NEMS.2010.5592211 | nano/micro engineered and molecular systems |
Keywords | Field | DocType |
HAST,MEMS,Reliability | Stress test,Composite material,Microelectromechanical systems,Connotation,Stress measurement,Materials science,Reliability engineering,Forensic engineering | Conference |
Volume | Issue | Citations |
null | null | 0 |
PageRank | References | Authors |
0.34 | 0 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Zhen Wang | 1 | 44 | 20.61 |
| Lixin Xu | 2 | 1 | 2.39 |
| Zhao Wang | 3 | 0 | 2.03 |
| He-Ming Zhao | 4 | 11 | 7.99 |
| Rongchang Song | 5 | 0 | 1.01 |
| Wenzhong Lou | 6 | 3 | 8.81 |