Title
Failure Trace Analysis of Timed Circuits for Automatic Timing Constraints Derivation
Abstract
This work proposes a technique to automatically obtain timing constraints for a given timed circuit to operate correctly. A designated set of delay parameters of a circuit are first set to sufficiently large bounds, and verification runs followed by failure analysis are repeated. Each verification run performs timed state space enumeration under the given delay bounds, and produces a failure trace if it exists. The failure trace is analyzed, and sufficient timing constraints to prevent the failure are obtained. Then, the delay bounds are tightened according to the timing constraints by using an ILP (Integer Linear Programming) solver. This process terminates when either some delay bounds under which no failure is detected are found or no new delay bounds to prevent the failures can be obtained. The experimental results using a naive implementation show that the proposed method can efficiently handle asynchronous benchmark circuits and nontrivial GasP circuits.
Year
DOI
Venue
2005
10.1093/ietisy/e88-d.11.2555
IEICE Transactions
Keywords
Field
DocType
verification run,automatic timing,delay parameter,failure trace analysis,asynchronous benchmark circuit,new delay,nontrivial gasp circuit,failure trace,failure analysis,timing constraint,delay bound,sufficient timing constraint,timed circuits
Asynchronous communication,Trace analysis,Computer science,Circuit design,Algorithm,Integer programming,Solver,Formal methods,Electronic circuit,State space enumeration
Journal
Volume
Issue
ISSN
E88-D
11
1745-1361
Citations 
PageRank 
References 
0
0.34
0
Authors
3
Name
Order
Citations
PageRank
Tomoya Kitai1121.73
Tomohiro Yoneda235341.62
Chris Myers37210.44