Name
Abstract | ||
|---|---|---|
In this paper, we propose a hybrid test application in partial skewed-load (PSL) scan design. The PSL scan design in which some flip-Flops (FFs) are controlled as skewed-load FFs and the others are controlled as broad-side FFs was proposed in [1]. We notice that the PSL scan design potentially has a capability of two test application modes: one is the broad-side test mode, and the other is the hybrid test mode Which corresponds to the test application considered in [1]. According to this observation, we present a hybrid test application of the two test modes in the PSL scan design. In addition, we also address a way of skewed-load FF selection based on propagation dominance of FFs in order to take advantage of the hybrid test application. Experimental results for ITC'99 benchmark circuits show that the hybrid test application in the proposed PSL scan design can achieve higher fault coverage than the design based on the skewed-load FF selection [1] does. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1587/transfun.E94.A.2571 | IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES |
Keywords | Field | DocType |
delay testing, design-for-testability, skewed-load test application, broad-side test application, partial skewed-load scan design, hybrid test application | Design for testing,Automatic test pattern generation,Fault coverage,Scan chain,Algorithm,PSL,Electronic circuit,Test compression,Mathematics | Journal |
Volume | Issue | ISSN |
E94A | 12 | 0916-8508 |
Citations | PageRank | References |
0 | 0.34 | 11 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yuki Yoshikawa | 1 | 28 | 4.51 |
| Tomomi Nuwa | 2 | 0 | 0.68 |
| Hideyuki Ichihara | 3 | 96 | 18.92 |
| Tomoo Inoue | 4 | 352 | 47.23 |