Paper Info
Title
Functional level embedded self testing for Walsh transform based adaptive hardware
Abstract
The paper presents an embedded self test circuit for adaptive systems whose exact specification is unknown. In particular, a functional testing mechanism for systems that have an acceptable representation as polynomials of low order is introduced. The testing mechanism is based on linear-checks and is suitable for Walsh transform based architectures. The paper shows that it is possible to define a small set of linear-checks which does not depend on the actual functionality that the hardware has converged to. Moreover, the check-set can be defined even without knowing the number of input variables nor their precision. In addition, the implementation cost of this testing scheme is negligible in respect to the cost of overall system.
Year
DOI
Venue
2012
10.1109/IOLTS.2012.6313857
On-Line Testing Symposium
Keywords
DocType
ISSN
implementation cost,embedded self test circuit,exact specification,input variable,testing mechanism,embedded self testing,adaptive hardware,functional level,adaptive system,acceptable representation,actual functionality,functional testing mechanism,testing scheme,vectors,hardware,radiation detectors,computer architecture,adaptive systems,embedded systems,polynomials,testing
Conference
1942-9398
ISBN
Citations 
PageRank 
978-1-4673-2082-5
1
0.43
References 
Authors
2
2
Name
Order
Citations
PageRank
Ariel Burg110.77
Osnat Keren210620.19