Title
Development of audit system for intellectual property management excellence
Abstract
Intellectual property (IP) management has been widely accepted as an important topic to support the technological innovation. In order to effectively and efficiently implement IP management, it is more practical to firstly focus on the most important aspects which, in turn, provide immediate beneficial results to allow organizations to further implementing other aspects by allocating more resources. The authors propose an IP management excellence audit system that breaks down the complicated IP management practices into a list of enabling criteria and the IP management performance in various criteria can be measured in details. The enabling criteria are the critical success factors to good IP management system and practice. Analytic hierarchy process approach is used to determine the relative importance among the identified criteria in the IP management excellence audit system. The evidential reasoning approach is adopted to develop an expert assessment tool to carry out the audit of organizations' performance in IP management. Based on the audit results, organizations will know the strength and weakness of their current IP management practice and can allocate resources and efforts in priority area for improvement. The authors have validated the developed system and tool in HK-Guangdong (HK-GD) based manufacturing organizations with satisfactory outcome. The audit results are helpful to provide top management facts and information to develop action plans for improving IP management. This paper presents the proposed IP audit system and the industrial case study with the development of an expert assessment tool.
Year
DOI
Venue
2010
10.1016/j.eswa.2009.12.059
Expert Syst. Appl.
Keywords
Field
DocType
complicated ip management practice,expert assessment tool,key enabling criteria,good ip management system,intellectual property management excellence,audit result,ip management,ip management excellence audit,ip management performance,evidential reasoning,proposed ip audit system,current ip management practice,top management fact,china manufacturing industry,intellectual property management,analytic hierarchy process,manufacturing industry,intellectual property,management system,critical success factor
Critical success factor,Computer science,Knowledge management,Artificial intelligence,IP address management,Internal audit,Excellence,Analytic hierarchy process,Audit,Intellectual property,Evidential reasoning approach,Machine learning,Process management
Journal
Volume
Issue
ISSN
37
6
Expert Systems With Applications
Citations 
PageRank 
References 
2
0.71
10
Authors
2
Name
Order
Citations
PageRank
Tak-Wing Liu120.71
Kwai-Sang Chin2103354.69