Abstract | ||
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Reliability of systems used in space, avionic and biomedical applications is highly critical. Such systems consist of an analog front-end to collect data, an ADC to convert the collected data to digital form and a digital unit to process it. The reliability of these systems is affected by the ability of its constituent blocks to tolerate faults. Therefore, it is necessary to increase the reliability of ADCs to ensure a highly reliable critical system. This paper illustrates the steps involved in the reliability enhancement of ADCs by first proposing a methodology for fault sensitivity analysis and then illustrating redesign techniques to improve the reliability of the highly sensitive(to faults) blocks. |
Year | DOI | Venue |
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2001 | 10.1109/DFTVS.2001.966788 | DFT |
Keywords | Field | DocType |
constituent block,reliable critical system,illustrating redesign technique,digital form,analog-to-digital converters,reliability enhancement,analog front-end,biomedical application,digital unit,fault sensitivity analysis,redundancy,sensitivity analysis,fault tolerance,very large scale integration | Flight dynamics (spacecraft),Computer science,Critical system,Avionics,Real-time computing,Electronic engineering,To digital converter,Redundancy (engineering),Fault tolerance,Pattern detection,Very-large-scale integration,Reliability engineering | Conference |
ISSN | ISBN | Citations |
1550-5774 | 0-7695-1203-8 | 7 |
PageRank | References | Authors |
1.75 | 3 | 2 |
Name | Order | Citations | PageRank |
---|---|---|---|
Mandeep Singh | 1 | 82 | 16.65 |
Israel Koren | 2 | 1579 | 175.07 |