Name
Title | ||
|---|---|---|
Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements |
Abstract | ||
|---|---|---|
As process technology further scales, aging, noise and variations in integrated circuits (ICs) and systems become a major challenge to both the semiconductor and EDA industries, since a significantly increased mismatch is emerging between modeled and actual silicon behavior. Therefore, the addition of accurate and low-cost on-chip sensors is of great value to reduce the mismatch. This paper presents a standard-cell-based, novel, and accurate sensor for reliability analysis of digital ICs (Radic), in order to better understand the characteristics of gate/path aging and process variations' impact on timing performance. The Radic sensor performs aging, flip-flop (FF) metastability window and variation measurements on-chip. This sensor has been fabricated in a floating gate Freescale SOC in very advanced technology. The measurement results demonstrate that the resolution is better than 0.1ps, and the accuracy is kept throughout aging/process variation. Furthermore, reliability and FF metastability measurements are performed using the proposed sensor. The measurement results agree with the existing models. |
Year | DOI | Venue |
|---|---|---|
2012 | 10.1109/TEST.2012.6401593 | ITC |
Keywords | Field | DocType |
process variation,mismatch,integrated circuit reliability,standard-cell-based sensor,low-cost on-chip sensor,on-chip structure,integrated circuits,ff metastability measurement,flip-flop,metastability window measurement,measurement result,aging sensor,advanced technology,on-chip aging,system-on-chip,metastability measurements,proposed sensor,frequency/delay sensor,nbti,reliability,hci,flip-flops,process technology,radic sensor,radic,digital ics,ageing,flip-flop metastability measurement,logic testing,accurate sensor,system on chip | Logic gate,System on a chip,Computer science,Electronic engineering,Process variation,Standard cell,Metastability,Flip-flop,Integrated circuit,Electrical engineering,Semiconductor | Conference |
ISSN | ISBN | Citations |
1089-3539 | 978-1-4673-1594-4 | 3 |
PageRank | References | Authors |
0.40 | 11 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Xiaoxiao Wang | 1 | 307 | 30.97 |
| LeRoy Winemberg | 2 | 75 | 11.09 |
| Nisar Ahmed | 3 | 412 | 36.29 |
| Mohammad Tehranipoor | 4 | 3181 | 243.40 |
| Saji George | 5 | 10 | 1.57 |
| Dat Tran | 6 | 454 | 78.64 |
| Allan Dobin | 7 | 3 | 0.74 |
| Steve Palosh | 8 | 3 | 0.74 |