Name
Title | ||
|---|---|---|
A BIST scheme for operational amplifier by checking the stable output of transient response. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/ECCTD.2011.6043816 | ECCTD |
Keywords | Field | DocType |
operational amplifier,voltage follower,signal generators,fault coverage,transient response,operational amplifiers,testing,transistors | Transient response,Fault coverage,Computer science,Control theory,Voltage,Buffer amplifier,Electronic engineering,CMOS,Op amp integrator,Electrical engineering,Operational amplifier,Built-in self-test | Conference |
Citations | PageRank | References |
0 | 0.34 | 3 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jun Yuan | 1 | 244 | 23.10 |
| Masayoshi Tachibana | 2 | 1 | 2.73 |