Title
Measuring the quality of shifting and scaling patterns in biclusters
Abstract
The most widespread biclustering algorithms use the Mean Squared Residue (MSR) as measure for assessing the quality of biclusters. MSR can identify correctly shifting patterns, but fails at discovering biclusters presenting scaling patterns. Virtual Error (VE) is a measure which improves the performance of MSR in this sense, since it is effective at recognizing biclusters containing shifting patters or scaling patterns as quality biclusters. However, VE presents some drawbacks when the biclusters present both kind of patterns simultaneously. In this paper, we propose a improvement of VE that can be integrated in any heuristic to discover biclusters with shifting and scaling patterns simultaneously.
Year
DOI
Venue
2010
10.1007/978-3-642-16001-1_21
PRIB
Keywords
Field
DocType
scaling pattern,quality biclusters,virtual error,widespread biclustering algorithm,mean squared residue
Data mining,Heuristic,Computer science,Artificial intelligence,Bioinformatics,Biclustering,Scaling,Machine learning
Conference
Volume
ISSN
ISBN
6282
0302-9743
3-642-16000-X
Citations 
PageRank 
References 
8
0.45
17
Authors
3
Name
Order
Citations
PageRank
Beatriz Pontes1675.36
Raúl Giráldez210510.26
Jesús S. Aguilar-ruiz362559.56