Title | ||
---|---|---|
Defect- and fault-tolerant static ram module designs based on parity checking and automatic testing |
Year | DOI | Venue |
---|---|---|
1993 | 10.1002/scj.4690240201 | Systems and Computers in Japan |
Keywords | Field | DocType |
fault tolerance,redundancy,fault tolerant,static ram | Parity bit,Computer science,Computer data storage,Redundancy (engineering),Artificial intelligence,Computer hardware,Integrated circuit,Computer vision,Parallel computing,CMOS,Static random-access memory,Error detection and correction,Fault tolerance | Journal |
Volume | Issue | Citations |
24 | 2 | 0 |
PageRank | References | Authors |
0.34 | 0 | 1 |
Name | Order | Citations | PageRank |
---|---|---|---|
Nobuo Tsuda | 1 | 24 | 6.78 |