Name
Title | ||
|---|---|---|
A 0.1e- vertical FPN 4.7e- read noise 71dB DR CMOS image sensor with 13b column-parallel single-ended cyclic ADCs. |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1109/ISSCC.2009.4977411 | ISSCC |
Keywords | Field | DocType |
side effect,capacitors,noise,pixel resolution,cmos image sensor,image resolution,dynamic range,sar adc,satisfiability,linearity,gain,visualization,pixel | Fixed-pattern noise,Dynamic range,Image sensor,Computer science,Effective number of bits,CMOS,Electronic engineering,Successive approximation ADC,Image resolution,High dynamic range,Electrical engineering | Conference |
Citations | PageRank | References |
6 | 1.90 | 2 |
Authors | ||
11 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jongho Park | 1 | 130 | 16.29 |
| Satoshi Aoyama | 2 | 44 | 8.57 |
| Takashi Watanabe | 3 | 43 | 7.24 |
| Tomoyuki Akahori | 4 | 17 | 4.76 |
| Tomohiko Kosugi | 5 | 17 | 5.10 |
| Keigo Isobe | 6 | 54 | 9.28 |
| Yuichi Kaneko | 7 | 33 | 5.49 |
| Zheng Liu | 8 | 6 | 2.91 |
| Kazuki Muramatsu | 9 | 6 | 1.90 |
| Takeshi Matsuyama | 10 | 6 | 2.24 |
| Takeshi Kawahito | 11 | 6 | 1.90 |