Name
Abstract | ||
|---|---|---|
Test compression / decompression using variable-length coding is an efficient method for reducing the test application cost, i.e., test application time and the size of the storage of an LSI tester. However, some coding techniques impose slow test application, and consequently a large test application time is required despite the high compression. In this paper, we clarify the fact that test application time depends on the compression ratio and the length of codewords and then propose a new Huffman-based coding method for achieving small test application time in a given test environment. The proposed coding method adjusts both of the compression ratio and the minimum length of the codewords to the test environment. Experimental results show that the proposed method can achieve small test application time while keeping high compression ratio. |
Year | DOI | Venue |
|---|---|---|
2007 | 10.1093/ietisy/e90-d.8.1235 | IEICE Transactions |
Keywords | Field | DocType |
compression ratio,test application time,slow test application,test application cost,small test application time,high compression ratio,large test application time,high compression,test compression,test environment,compressed test application,variable-length coding adjustable,variable length code,huffman code | Compression (physics),Computer science,Coding (social sciences),Huffman coding,Artificial intelligence,Variable-length code,Context-adaptive binary arithmetic coding,Data compression ratio,Pattern recognition,Algorithm,Compression ratio,Test compression,Embedded system | Journal |
Volume | Issue | ISSN |
E90-D | 8 | 1745-1361 |
Citations | PageRank | References |
0 | 0.34 | 12 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hideyuki Ichihara | 1 | 96 | 18.92 |
| Toshihiro Ohara | 2 | 1 | 1.05 |
| Michihiro Shintani | 3 | 32 | 12.55 |
| Tomoo Inoue | 4 | 352 | 47.23 |